The RHEED system is a tool for in-situ monitoring of the growth structure of thin films.
The surface repurchase of the substrate and the crystal structure of the substrate or film surface can be analyzed through the RHEED pattern characteristics.
Through the change of diffraction intensity, the surface roughness of the film can be analyzed and the growth progress of the film can be monitored
UHV-LT-STM/Nc— AFM
MBE-500
CLOSED CYCLE LHe FREE STM / Nc-AFM
MBE-250
Environmental System（RT—STM/Nc—AFM）
Other Customized Ultra-high Vacuum Parts
Evaporator-EB
Low Temperature Dewar
Vacuum Chamber
Sample Storage Rack
Wobble Stick
Evaporator-DH