Environmental System（RT—STM/Nc

Environmental System（RT—STM/Nc—AFM）

Variable temperature range: RT-250℃

Scanning range: ≥5μm×5μm

Z direction: Maximum rough moving distance ≥5 mm

Feature: Variable temperature, micro-reaction chamber design, can realize the control of sample temperature and atmosphere environment SPM probe module, can realize STM and AFM measurement

CategoriesSystem

Product Description

Technical parameters:

The scanning head integrates scanning tunneling microscope (STM) and Atomic Force microscope (AFM) functions
STM can achieve HOPG or Si (111) atomic resolution
AFM can achieve HOPG or Si (111) atomic step resolution
The SPM sample table has a heating variable temperature function, including the temperature range of RT-250℃
The maximum rough moving distance in the Z direction is ≥5 mm
Scanning range: ≥5μm×5μm
The system can work in ultra-high vacuum environment (system limit vacuum ≤5×10-10 mbar). It can also work in an atmospheric environment